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sklademVydáno: 2002-08-30
IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 1: Généralités
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| Označení normy: | IEC 60749-1:2002 |
| Vydáno: | 2002-08-30 |
| Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 60749-1:2002
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.