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Homepage>IEC 60749-1:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
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sklademVydáno: 2002-08-30
IEC 60749-1:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General

IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 1: Généralités

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Označení normy:IEC 60749-1:2002
Vydáno:2002-08-30
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 60749-1:2002

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

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