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Homepage>IEC 60749-13:2018 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
sklademVydáno: 2018-02-15
IEC 60749-13:2018 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Dispositifs à seminconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13: Atmosphère saline

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Označení normy:IEC 60749-13:2018
Vydáno:2018-02-15
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 60749-13:2018

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).