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Homepage>IEC 60749-19:2003+AMD1:2010 CSV - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

IEC 60749-19:2003+AMD1:2010 CSV

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 19: Résistance de la pastille au cisaillement

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Označení normy:	IEC 60749-19:2003+AMD1:2010 CSV
Vydáno:	2010-11-29
Jazyk:	Anglicky/Francouzsky

DESCRIPTION

IEC 60749-19:2003+AMD1:2010 CSV

IEC 60749-19:2003+A1:2010 determines the integrity of materials and procedures used to attach semiconductor die to package headers or other substrates. This test method is generally only applicable to cavity packages or as a process monitor. It is not applicable for die areas greater than 10 mm2. It is also not applicable to flip chip technology or to flexible substrates. This consolidated version consists of the first edition (2003) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.

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