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Homepage>IEC 60749-23:2004 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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sklademVydáno: 2004-02-23
IEC 60749-23:2004 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

IEC 60749-23:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23 : Durée de vie en fonctionnement à haute température

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Označení normy:IEC 60749-23:2004
Vydáno:2004-02-23
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 60749-23:2004

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

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