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Homepage>IEC 60749-36:2003 - Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

sklademVydáno: 2003-02-13

IEC 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 36: Accélération constante

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Označení normy:	IEC 60749-36:2003
Vydáno:	2003-02-13
Jazyk:	Anglicky/Francouzsky

DESCRIPTION

IEC 60749-36:2003

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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