PRICES include / exclude VAT
sklademVydáno: 1983-01-01
IEC 60759:1983
Standard test procedures for semiconductor X-ray energy spectrometers
Méthodes d'essais normalisés des spectromètres d'énergie X à semicteur
Format
Availability
Price and currency
Anglicky/Francouzsky Hardcopy
skladem
306.00 €
Anglicky/Francouzsky PDF
Immediate download
306.00 €
| Označení normy: | IEC 60759:1983 |
| Vydáno: | 1983-01-01 |
| Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 60759:1983
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.