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Homepage>IEC 61163-1:2006 - Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
sklademVydáno: 2006-06-26
IEC 61163-1:2006 - Reliability stress screening - Part 1: Repairable assemblies manufactured in lots

IEC 61163-1:2006

Reliability stress screening - Part 1: Repairable assemblies manufactured in lots

Déverminage sous contraintes - Partie 1: Assemblages réparables fabriqués en lots

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Označení normy:IEC 61163-1:2006
Vydáno:2006-06-26
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 61163-1:2006

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.