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sklademVydáno: 1995-11-22
IEC 61580:1995
Measurement of return loss on waveguide and waveguide assemblies
Mesure des pertes de réflexion dans un guide d'ondes et des assemblages de guides d'ondes
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Označení normy: | IEC 61580:1995 |
Vydáno: | 1995-11-22 |
Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 61580:1995
Describes the sweep frequency method used for the measurement of return loss on waveguide and waveguide assemblies. The contents of the corrigendum of July 2006 have been included in this copy.