Vážení zákazníci, v letošním roce budeme expedovat poslední objednávky ve středu 18. 12. 2024.

Těšíme se s vámi na shledanou od pondělí 06. 01. 2025.

 

Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQInfobarE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>IEC 62047-21:2014 - Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
Sponsored link
sklademVydáno: 2014-06-19
IEC 62047-21:2014 - Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials

IEC 62047-21:2014

Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 21: Méthode d'essai relative au coefficient de Poisson des matériaux MEMS en couche mince

Format
Availability
Price and currency
Anglicky/Francouzsky Hardcopy
skladem
95.34 €
Anglicky/Francouzsky PDF
Immediate download
95.34 €
Označení normy:IEC 62047-21:2014
Vydáno:2014-06-19
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 62047-21:2014

IEC 62047-21:2014 specifies the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 µm.

Print