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Homepage>IEC 62047-3:2006 - Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
sklademVydáno: 2006-08-15
IEC 62047-3:2006 - Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

IEC 62047-3:2006

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 3: Eprouvette d'essai normalisée en couche mince pour l'essai de traction

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Anglicky/Francouzsky Hardcopy
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22.67 €
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Označení normy:IEC 62047-3:2006
Vydáno:2006-08-15
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 62047-3:2006

Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.