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Homepage>IEC 62047-40:2021 - Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
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sklademVydáno: 2021-09-03
IEC 62047-40:2021 - Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

IEC 62047-40:2021

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

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Označení normy:IEC 62047-40:2021
Vydáno:2021-09-03
Jazyk:Anglicky
DESCRIPTION

IEC 62047-40:2021

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

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