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sklademVydáno: 2006-07-18
IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Essai de stabilité de température en polarisation pour transistors à effet de champ métal-oxyde-semiconducteur (MOSFET)
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| Označení normy: | IEC 62373:2006 |
| Vydáno: | 2006-07-18 |
| Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 62373:2006
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)