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sklademVydáno: 2007-03-29
IEC 62374:2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Dispositifs à semiconducteurs - Essai de rupture diélectrique en fonction du temps (TDDB) pour films diélectriques de grille
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Anglicky/Francouzsky Hardcopy
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169.83 €
Anglicky/Francouzsky PDF
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| Označení normy: | IEC 62374:2007 |
| Vydáno: | 2007-03-29 |
| Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 62374:2007
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure