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sklademVydáno: 2017-01-27
IEC 62433-3:2017
EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
Modèles de circuits intégrés pour la CEM - Partie 3: Modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques - Modélisation des émissions rayonnées (ICEM-RE)
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Anglicky/Francouzsky Hardcopy
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Označení normy: | IEC 62433-3:2017 |
Vydáno: | 2017-01-27 |
Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 62433-3:2017
IEC 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model - Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.