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Homepage>IEC 62604-2:2022 RLV - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
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sklademVydáno: 2022-09-01
IEC 62604-2:2022 RLV - Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

IEC 62604-2:2022 RLV

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

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Označení normy:IEC 62604-2:2022 RLV
Vydáno:2022-09-01
Jazyk:Anglicky
DESCRIPTION

IEC 62604-2:2022 RLV

IEC 62604-2:2022 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 62604-2:2022 applies to duplexers which can separate receiving signals from transmitting signals and are key components for two-way radio communications, and which are generally used in mobile phone systems compliant with CDMA systems such as N-CDMA in second generation mobile telecommunication systems (2G), W-CDMA / UMTS (3G) or LTE (4G). These guidelines draw attention to some fundamental questions about the theory of SAW and BAW duplexers and how to use them, which will be considered by the user before he places an order for SAW and BAW duplexers for a new application. Such a procedure will be the user’s insurance against unsatisfactory performance. Because SAW and BAW duplexers have very similar performance for the usage, it is useful and convenient for users that both duplexers are described in one standard. This edition includes the following significant technical changes with respect to the previous edition: - the term "cross-isolation" has been added to Clause 3; - multiplexers are described. NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner, especially in mobile phone systems and have the same requirements of characteristics, test method and so on.