IEC 62899-203:2024

IEC 62899-203:2024 defines terms and specifies standard methods for characterization and evaluation of semiconductor inks and semiconductive layers that are made from semiconductor inks. This edition includes the following significant technical changes with respect to the previous edition: a) addition of 6.3.1.2.2 - Normalised on-current measurement of the TFT device; b) in 6.3.2, correction of formula for calculation of permittivity.