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Homepage>IEC 62899-503-1:2020 - Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
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sklademVydáno: 2020-05-27
IEC 62899-503-1:2020 - Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

IEC 62899-503-1:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

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Označení normy:IEC 62899-503-1:2020
Vydáno:2020-05-27
Jazyk:Anglicky
DESCRIPTION

IEC 62899-503-1:2020

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

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