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sklademVydáno: 2019-04-17
IEC 62951-2:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 2 : Méthode d’évaluation pour la mobilité des électrons, la pente en régime de sous-seuil et la tension de seuil des dispositifs souples
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| Označení normy: | IEC 62951-2:2019 |
| Vydáno: | 2019-04-17 |
| Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 62951-2:2019
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin‑film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.