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sklademVydáno: 2019-05-06
IEC 62951-6:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 6: Méthode d’essai pour la résistance de couche des couches conductrices souples
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Anglicky/Francouzsky Hardcopy
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Anglicky/Francouzsky PDF
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| Označení normy: | IEC 62951-6:2019 |
| Vydáno: | 2019-05-06 |
| Jazyk: | Anglicky/Francouzsky |
DESCRIPTION
IEC 62951-6:2019
IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.