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Homepage>IEC 63364-1:2022 - Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
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sklademVydáno: 2022-12-14
IEC 63364-1:2022 - Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

IEC 63364-1:2022

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour système IDO - Partie 1: Méthode d’essai de détection de variation acoustique

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Označení normy:IEC 63364-1:2022
Vydáno:2022-12-14
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 63364-1:2022

IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

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