PRICES include / exclude VAT
IEC Standards
IEC standardy v elektronickém formátu PDF
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
IEC 60761-5:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
Vydáno: 2002-01-16
Hardcopy
skladem
129.72 €
PDF
Immediate download
129.72 €
Hardcopy
skladem
45.12 €
PDF
Immediate download
45.12 €
IEC 60754-2:2011
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Vydáno: 2011-11-17
Hardcopy
skladem
129.72 €
PDF
Immediate download
129.72 €
Hardcopy
skladem
129.72 €
PDF
Immediate download
129.72 €
IEC 60749-33:2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Vydáno: 2004-03-09
Hardcopy
skladem
45.12 €
PDF
Immediate download
45.12 €
Hardcopy
skladem
45.12 €
PDF
Immediate download
45.12 €
IEC 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Vydáno: 2011-04-07
Hardcopy
skladem
169.20 €
PDF
Immediate download
169.20 €
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Vydáno: 2003-02-13
Hardcopy
skladem
11.28 €
PDF
Immediate download
11.28 €
IEC 60749-8:2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Vydáno: 2002-08-30
Hardcopy
skladem
90.24 €
PDF
Immediate download
90.24 €
IEC 60759:1983/AMD1:1991
Amendment 1 - Standard test procedures for semiconductor X-ray energy spectrometers
Amendment 1 - Standard test procedures for semiconductor X-ray energy spectrometers
Vydáno: 1991-11-15
Hardcopy
skladem
11.28 €
PDF
Immediate download
11.28 €
IEC 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
Vydáno: 2011-04-07
Hardcopy
skladem
169.20 €
PDF
Immediate download
169.20 €
IEC 60749-42:2014
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Vydáno: 2014-08-12
Hardcopy
skladem
22.56 €
PDF
Immediate download
22.56 €