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IEC 62264-3:2016
Enterprise-control system integration - Part 3: Activity models of manufacturing operations management
Enterprise-control system integration - Part 3: Activity models of manufacturing operations management
Vydáno: 2016-12-16
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412.54 €
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IEC 60793-1-61:2017
Optical fibres - Part 1-61: Measurement methods and test procedures - Polarization crosstalk
Optical fibres - Part 1-61: Measurement methods and test procedures - Polarization crosstalk
Vydáno: 2017-02-07
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IEC 61315:2019
Calibration of fibre-optic power meters
Calibration of fibre-optic power meters
Vydáno: 2019-03-29
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IEC 60749-23:2004/AMD1:2011
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Vydáno: 2011-01-27
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IEC 60749-23:2004+AMD1:2011 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Vydáno: 2011-03-30
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IEC 60749-24:2004
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Vydáno: 2004-03-09
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IEC 60749-34:2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Vydáno: 2010-10-28
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IEC 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Vydáno: 2006-07-18
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IEC 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Vydáno: 2011-07-13
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