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IEC 60601-1:2005/AMD2:2020
Amendment 2 - Medical electrical equipment - Part 1: General requirements for basic safety and essential performance
Amendment 2 - Medical electrical equipment - Part 1: General requirements for basic safety and essential performance
Vydáno: 2020-08-20
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IEC 62433-1:2019
EMC IC modelling - Part 1: General modelling framework
EMC IC modelling - Part 1: General modelling framework
Vydáno: 2019-03-08
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136.61 €
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IEC 60050-702:1992/AMD2:2016
Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
Vydáno: 2016-12-16
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23.76 €
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47.52 €
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IEC 61760-4:2015/AMD1:2018
Amendment 1 - Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices
Amendment 1 - Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices
Vydáno: 2018-03-13
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11.88 €
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IEC 60793-1-61:2017
Optical fibres - Part 1-61: Measurement methods and test procedures - Polarization crosstalk
Optical fibres - Part 1-61: Measurement methods and test procedures - Polarization crosstalk
Vydáno: 2017-02-07
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IEC 60754-1:2011
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
Vydáno: 2011-11-17
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IEC 60763-1:2010
Laminated pressboard for electrical purposes - Part 1: Definitions, classification and general requirements
Laminated pressboard for electrical purposes - Part 1: Definitions, classification and general requirements
Vydáno: 2010-08-06
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IEC 60749-38:2008
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Vydáno: 2008-02-12
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IEC 60759:1983
Standard test procedures for semiconductor X-ray energy spectrometers
Standard test procedures for semiconductor X-ray energy spectrometers
Vydáno: 1983-01-01
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IEC 60761-1:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
Vydáno: 2002-01-17
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