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IEC standardy v elektronickém formátu PDF
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IEC 61443:1999+AMD1:2008 CSV
Short-circuit temperature limits of electric cables with rated voltages above 30 kV (Um = 36 kV)
Short-circuit temperature limits of electric cables with rated voltages above 30 kV (Um = 36 kV)
Vydáno: 2008-11-13
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47.70 €
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IEC 61467:2008
Insulators for overhead lines - Insulator strings and sets for lines with a nominal voltage greater than 1 000 V - AC power arc tests
Insulators for overhead lines - Insulator strings and sets for lines with a nominal voltage greater than 1 000 V - AC power arc tests
Vydáno: 2008-08-12
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IEC 61478:2001/AMD1:2003
Amendment 1 - Live working - Ladders of insulating material
Amendment 1 - Live working - Ladders of insulating material
Vydáno: 2003-02-19
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IEC 61429:1995
Marking of secondary cells and batteries with the international recycling symbol ISO 7000-1135
Marking of secondary cells and batteries with the international recycling symbol ISO 7000-1135
Vydáno: 1995-12-05
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IEC 61478:2001
Live working - Ladders of insulating material
Live working - Ladders of insulating material
Vydáno: 2001-10-16
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IEC 62047-3:2006
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Vydáno: 2006-08-15
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IEC 62047-5:2011
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Vydáno: 2011-07-13
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IEC 62044-2:2005
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
Vydáno: 2005-03-07
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IEC 62047-19:2013
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Vydáno: 2013-07-17
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IEC 62047-2:2006
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Vydáno: 2006-08-15
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