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IEC 60749-23:2004+AMD1:2011 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Vydáno: 2011-03-30
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95.36 €
IEC 60749-24:2004
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Vydáno: 2004-03-09
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47.68 €
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47.68 €
IEC 60749-34:2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Vydáno: 2010-10-28
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47.68 €
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47.68 €
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137.07 €
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137.07 €
IEC 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Vydáno: 2006-07-18
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95.36 €
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95.36 €
IEC 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Vydáno: 2011-07-13
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178.79 €
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178.79 €
Hardcopy
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178.79 €
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178.79 €
IEC 60793-1-20:2014
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
Vydáno: 2014-10-10
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321.83 €
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321.83 €
IEC 60767:1983
Helical-scan video-tape cassette system using 12.65 mm (0.5 in) magnetic tape on type beta-format
Helical-scan video-tape cassette system using 12.65 mm (0.5 in) magnetic tape on type beta-format
Vydáno: 1983-01-01
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280.11 €
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280.11 €
IEC 60793-1-51:2014
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
Vydáno: 2014-02-05
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23.84 €
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23.84 €
IEC 60793-1-42:2013
Optical fibres - Part 1-42: Measurement methods and test procedures - Chromatic dispersion
Optical fibres - Part 1-42: Measurement methods and test procedures - Chromatic dispersion
Vydáno: 2013-01-24
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226.47 €
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226.47 €
IEC 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Vydáno: 2017-03-03
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