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IEC 61429:1995
Marking of secondary cells and batteries with the international recycling symbol ISO 7000-1135
Marking of secondary cells and batteries with the international recycling symbol ISO 7000-1135
Vydáno: 1995-12-05
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IEC 61479:2001/AMD1:2002
Amendment 1 - Live working - Flexible conductor covers (line hoses) of insulating material
Amendment 1 - Live working - Flexible conductor covers (line hoses) of insulating material
Vydáno: 2002-05-08
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IEC 61501:1998
Nuclear reactor instrumentation - Wide range neutron fluence rate meter - Mean square voltage method
Nuclear reactor instrumentation - Wide range neutron fluence rate meter - Mean square voltage method
Vydáno: 1998-11-10
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266.07 €
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IEC 62047-20:2014
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Vydáno: 2014-06-26
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339.67 €
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IEC 62044-1:2002
Cores made of soft magnetic materials - Measuring methods - Part 1: Generic specification
Cores made of soft magnetic materials - Measuring methods - Part 1: Generic specification
Vydáno: 2002-05-28
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IEC 62053-11:2003
Electricity metering equipment (a.c.) - Particular requirements - Part 11: Electromechanical meters for active energy (classes 0,5, 1 and 2)
Electricity metering equipment (a.c.) - Particular requirements - Part 11: Electromechanical meters for active energy (classes 0,5, 1 and 2)
Vydáno: 2003-01-28
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IEC 62047-8:2011
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Vydáno: 2011-03-14
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IEC 62047-9:2011
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Vydáno: 2011-07-13
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IEC TR 62048:2014
Optical fibres - Reliability - Power law theory
Optical fibres - Reliability - Power law theory
Vydáno: 2014-01-22
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215.12 €
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IEC 62047-14:2012
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Vydáno: 2012-02-28
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IEC 62037-4:2012
Passive RF and microwave devices, intermodulation level measurement - Part 4: Measurement of passive intermodulation in coaxial cables
Passive RF and microwave devices, intermodulation level measurement - Part 4: Measurement of passive intermodulation in coaxial cables
Vydáno: 2012-07-24
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