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IEC 60747-16-3:2002/AMD1:2009
Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Amendment 1 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Vydáno: 2009-03-10
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IEC 60748-3:1986
Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
Vydáno: 1986-01-01
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449.42 €
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IEC 60749-16:2003
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Vydáno: 2003-01-17
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168.53 €
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IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Vydáno: 2002-08-30
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387.63 €
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387.63 €
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89.88 €
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IEC 61609:1996
Microwave ferrite components - Guide for the drafting ofspecifications
Microwave ferrite components - Guide for the drafting ofspecifications
Vydáno: 1996-02-07
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IEC TR 61641:2014
Enclosed low-voltage switchgear and controlgear assemblies - Guide for testing under conditions of arcing due to internal fault
Enclosed low-voltage switchgear and controlgear assemblies - Guide for testing under conditions of arcing due to internal fault
Vydáno: 2014-09-09
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IEC 61642:1997
Industrial a.c. networks affected by harmonics - Application of filters and shunt capacitors
Industrial a.c. networks affected by harmonics - Application of filters and shunt capacitors
Vydáno: 1997-09-17
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IEC 61643-11:2011
Low-voltage surge protective devices - Part 11: Surge protective devices connected to low-voltage power systems - Requirements and test methods
Low-voltage surge protective devices - Part 11: Surge protective devices connected to low-voltage power systems - Requirements and test methods
Vydáno: 2011-03-09
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421.33 €
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IEC 61671:2012
Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Vydáno: 2012-06-21
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