PRICES include / exclude VAT
IEC Standards
IEC standardy v elektronickém formátu PDF
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
IEC 60749-23:2004+AMD1:2011 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Vydáno: 2011-03-30
Hardcopy
skladem
95.17 €
PDF
Immediate download
95.17 €
IEC 60749-24:2004
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
Vydáno: 2004-03-09
Hardcopy
skladem
47.58 €
PDF
Immediate download
47.58 €
IEC 60749-34:2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Vydáno: 2010-10-28
Hardcopy
skladem
47.58 €
PDF
Immediate download
47.58 €
Hardcopy
skladem
136.80 €
PDF
Immediate download
136.80 €
IEC 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Vydáno: 2006-07-18
Hardcopy
skladem
95.17 €
PDF
Immediate download
95.17 €
IEC 60749-40:2011
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge
Vydáno: 2011-07-13
Hardcopy
skladem
178.44 €
PDF
Immediate download
178.44 €
Hardcopy
skladem
178.44 €
PDF
Immediate download
178.44 €
IEC 60793-1-20:2014
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
Vydáno: 2014-10-10
Hardcopy
skladem
321.19 €
PDF
Immediate download
321.19 €
IEC 60767:1983
Helical-scan video-tape cassette system using 12.65 mm (0.5 in) magnetic tape on type beta-format
Helical-scan video-tape cassette system using 12.65 mm (0.5 in) magnetic tape on type beta-format
Vydáno: 1983-01-01
Hardcopy
skladem
279.55 €
PDF
Immediate download
279.55 €
IEC 60793-1-51:2014
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
Optical fibres - Part 1-51: Measurement methods and test procedures - Dry heat (steady state) tests
Vydáno: 2014-02-05
Hardcopy
skladem
23.79 €
PDF
Immediate download
23.79 €
IEC 60793-1-42:2013
Optical fibres - Part 1-42: Measurement methods and test procedures - Chromatic dispersion
Optical fibres - Part 1-42: Measurement methods and test procedures - Chromatic dispersion
Vydáno: 2013-01-24
Hardcopy
skladem
226.02 €
PDF
Immediate download
226.02 €
IEC 60749-9:2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Vydáno: 2017-03-03
Hardcopy
skladem
47.58 €
PDF
Immediate download
47.58 €