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IEC 60748-2-2:1992/AMD1:1994
Amendment 1 - Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU

Vydáno: 1994-06-07

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IEC 60748-4:1997
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits

Vydáno: 1997-04-23

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508.20 €

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IEC 60748-2-3:1992
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)

Vydáno: 1992-02-20

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IEC 60748-2-4:1992
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section four: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB

Vydáno: 1992-01-30

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IEC 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Vydáno: 2003-02-13

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IEC 61672-3:2013
Electroacoustics - Sound level meters - Part 3: Periodic tests

Vydáno: 2013-09-30

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IEC 61643-21:2000/AMD1:2008
Amendment 1 - Low voltage surge protective devices - Part 21: Surge protective devices connected to telecommunications and signalling networks - Performance requirements and testing methods

Vydáno: 2008-04-25

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IEC 61619:1997
Insulating liquids - Contamination by polychlorinated biphenyls (PCBs) - Method of determination by capillary column gas chromatography

Vydáno: 1997-04-10

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IEC 61621:1997
Dry, solid insulating materials - Resistance test to high-voltage, low-current arc discharges

Vydáno: 1997-09-17

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IEC 61628-2:1998/AMD1:2007
Amendment 1 - Corrugated pressboard and presspaper for electrical purposes - Part 2: Methods of test

Vydáno: 2007-06-06

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IEC 61660-2:1997
Short-circuit currents in d.c. auxiliary installations in power plants and substations - Part 2: Calculation of effects

Vydáno: 1997-06-17

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IEC 61628-2:1998+AMD1:2007 CSV
Corrugated pressboard and presspaper for electrical purposes - Part 2: Methods of test

Vydáno: 2007-07-30

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