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IEC 60050-447:2020
International Electrotechnical Vocabulary (IEV) - Part 447: Measuring relays and protection equipment
International Electrotechnical Vocabulary (IEV) - Part 447: Measuring relays and protection equipment
Vydáno: 2020-05-26
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IEC 63138-1:2019
Multi-channel radio frequency connectors - Part 1: Generic specification - General requirements and test methods
Multi-channel radio frequency connectors - Part 1: Generic specification - General requirements and test methods
Vydáno: 2019-09-12
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280.56 €
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IEC 63093-8:2018
Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 8: E-cores
Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 8: E-cores
Vydáno: 2018-06-27
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226.83 €
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IEC 63093-11:2018
Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 11: EC-cores for use in power supply applications
Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 11: EC-cores for use in power supply applications
Vydáno: 2018-06-21
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IEC 60455-3-8:2021
Resin based reactive compounds used for electrical insulation - Part 3-8: Specifications for individual materials - Resins for cable accessories
Resin based reactive compounds used for electrical insulation - Part 3-8: Specifications for individual materials - Resins for cable accessories
Vydáno: 2021-06-16
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183.67 €
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64.28 €
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IEC 60851-2:2009+AMD1:2015 CSV
Winding wires - Test methods - Part 2: Determination of dimensions
Winding wires - Test methods - Part 2: Determination of dimensions
Vydáno: 2015-05-21
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IEC 61034-1:2005+AMD1:2013 CSV
Measurement of smoke density of cables burning under defined conditions - Part 1: Test apparatus
Measurement of smoke density of cables burning under defined conditions - Part 1: Test apparatus
Vydáno: 2013-06-21
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173.11 €
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IEC 62047-34:2019
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Vydáno: 2019-04-05
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95.51 €
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IEC 62677-2:2017
Heat shrinkable low and medium voltage moulded shapes - Part 2: Methods of test
Heat shrinkable low and medium voltage moulded shapes - Part 2: Methods of test
Vydáno: 2017-10-11
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226.83 €
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IEC 60679-1:2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
Vydáno: 2017-07-26
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