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Homepage>IEC TS 62878-2-4:2015 - Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
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sklademVydáno: 2015-03-27
IEC TS 62878-2-4:2015 - Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

IEC TS 62878-2-4:2015

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

Substrat avec appareil(s) intégré(s) - Partie 2-4: Directives - Groupes d'éléments d'essai (TEG)

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Označení normy:IEC TS 62878-2-4:2015
Vydáno:2015-03-27
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC TS 62878-2-4:2015

IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

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