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Homepage>ISO 11505:2012-Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
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sklademVydáno: 2012
ISO 11505:2012-Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

ISO 11505:2012

ISO 11505:2012-Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

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Označení normy:ISO 11505:2012
Počet stran:33
Vydání:1
Vydáno:2012
Jazyk:Anglicky
DESCRIPTION

ISO 11505:2012


ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
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