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sklademVydáno: 2017
ISO 15470:2017
ISO 15470:2017-Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
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Anglicky PDF
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| Označení normy: | ISO 15470:2017 |
| Počet stran: | 5 |
| Vydání: | 2 |
| Vydáno: | 2017 |
| Jazyk: | Anglicky |
DESCRIPTION
ISO 15470:2017
ISO 15470:2017 describes the way in which specific aspects of the performance of an X-ray photoelectron spectrometer are described.