Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>ISO/TS 10798:2011-Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Sponsored link
sklademVydáno: 2011
ISO/TS 10798:2011-Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

ISO/TS 10798:2011

ISO/TS 10798:2011-Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Format
Availability
Price and currency
Anglicky PDF
Immediate download
184.00 €
Francouzsky PDF
Immediate download
184.00 €
Anglicky Hardcopy
In stock
184.00 €
Francouzsky Hardcopy
In stock
184.00 €
Označení normy:ISO/TS 10798:2011
Počet stran:26
Vydání:1
Vydáno:2011
DESCRIPTION

ISO/TS 10798:2011


ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis. The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).
Print