Vážení zákazníci, v letošním roce budeme expedovat poslední objednávky ve středu 18. 12. 2024.

Těšíme se s vámi na shledanou od pondělí 06. 01. 2025.

 

Menu
0
Total price
0 €
PRICES include / exclude VAT
Homepage>PD CEN/TR 10353:2011 Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry
Sponsored link
sklademVydáno: 2011-11-30
PD CEN/TR 10353:2011 Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry

PD CEN/TR 10353:2011

Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
318.39 €
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
31.84 €
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
95.52 €
Anglicky Hardcopy
In stock
318.39 €
Označení normy:PD CEN/TR 10353:2011
Počet stran:34
Vydáno:2011-11-30
ISBN:978 0 580 73228 7
Status:Standard
DESCRIPTION

PD CEN/TR 10353:2011


This standard PD CEN/TR 10353:2011 Chemical analysis of ferrous materials. Analysis of ferro-silicon. Determination of Al, Ti and P by inductively coupled plasma optical emission spectrometry is classified in these ICS categories:
  • 77.080.10 Irons

This Technical Report describes an inductively coupled plasma optical emission spectrometric method for the determination of Al, Ti and P contents in ferro-silicon materials.

The method is applicable to:

  • Al contents between 0,2 and 2 %;

  • Ti contents between 0,02 and 0,25 %;

  • P contents between 0,005 and 0,05 %.

The procedure is valid for the analytical lines given in Table 1. This table also gives, for each line, the spectral interferences, which shall be corrected.

NOTE The interferences extent as well as other possible interferences depend on the temperature in the plasma and on the optical resolution of the spectrometer used.

Table 1 — Spectral lines recommended together with the interferences which shall be corrected

Element Wavelength (nm) Interferences
Al 308,22 V
Ti 337,28 V, Ni
P 178,29 Mo