PD IEC/TR 61967-1-1:2015

This standard PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions is classified in these ICS categories:

• 31.200 Integrated circuits. Microelectronics

This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation or computation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission and immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.