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sklademVydáno: 2018-01-29
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
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| Označení normy: | PD IEC/TR 63133:2017 |
| Počet stran: | 20 |
| Vydáno: | 2018-01-29 |
| ISBN: | 978 0 580 98851 6 |
| Status: | Standard |
DESCRIPTION
PD IEC/TR 63133:2017
This standard PD IEC/TR 63133:2017 Semiconductor devices. Scan based ageing level estimation for semiconductor devices is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.