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Homepage>PD IEC/TS 62878-2-4:2015 Device embedded substrate Guidelines. Test element groups (TEG)
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sklademVydáno: 2015-04-30
PD IEC/TS 62878-2-4:2015 Device embedded substrate Guidelines. Test element groups (TEG)

PD IEC/TS 62878-2-4:2015

Device embedded substrate Guidelines. Test element groups (TEG)

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Označení normy:PD IEC/TS 62878-2-4:2015
Počet stran:40
Vydáno:2015-04-30
ISBN:978 0 580 82121 9
Status:Standard
DESCRIPTION

PD IEC/TS 62878-2-4:2015


This standard PD IEC/TS 62878-2-4:2015 Device embedded substrate is classified in these ICS categories:
  • 31.180 Printed circuits and boards
  • 31.190 Electronic component assemblies

This part of IEC 62878 describes the test element group devices useful when measuring basic properties of device embedded substrates.

This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

The IEC 62878 series neither applies to the re-distribution layer (RDL) nor to the electronic modules defined as an M-type business model in IEC 62421.