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sklademVydáno: 2019-12-13
PD ISO/TS 10867:2019
Nanotechnologies. Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
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| Označení normy: | PD ISO/TS 10867:2019 |
| Počet stran: | 26 |
| Vydáno: | 2019-12-13 |
| ISBN: | 978 0 539 03449 3 |
| Status: | Standard |
DESCRIPTION
PD ISO/TS 10867:2019
This standard PD ISO/TS 10867:2019 Nanotechnologies. Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy is classified in these ICS categories:
- 07.120 Nanotechnologies
This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.
It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.
The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.