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IEC 61467:2008
Insulators for overhead lines - Insulator strings and sets for lines with a nominal voltage greater than 1 000 V - AC power arc tests
Insulators for overhead lines - Insulator strings and sets for lines with a nominal voltage greater than 1 000 V - AC power arc tests
Vydáno: 2008-08-12
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308.76 €
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308.76 €
IEC 61478:2001/AMD1:2003
Amendment 1 - Live working - Ladders of insulating material
Amendment 1 - Live working - Ladders of insulating material
Vydáno: 2003-02-19
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11.44 €
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11.44 €
IEC 61429:1995
Marking of secondary cells and batteries with the international recycling symbol ISO 7000-1135
Marking of secondary cells and batteries with the international recycling symbol ISO 7000-1135
Vydáno: 1995-12-05
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22.87 €
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22.87 €
IEC 61478:2001
Live working - Ladders of insulating material
Live working - Ladders of insulating material
Vydáno: 2001-10-16
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268.73 €
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268.73 €
Hardcopy
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686.13 €
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686.13 €
IEC 62047-3:2006
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
Vydáno: 2006-08-15
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22.87 €
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22.87 €
IEC 62047-5:2011
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Vydáno: 2011-07-13
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268.73 €
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268.73 €
IEC 62044-2:2005
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
Vydáno: 2005-03-07
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268.73 €
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268.73 €
IEC 62047-19:2013
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
Vydáno: 2013-07-17
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217.27 €
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217.27 €
IEC 62047-2:2006
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
Vydáno: 2006-08-15
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91.48 €
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91.48 €
Hardcopy
skladem
91.48 €
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91.48 €
Hardcopy
skladem
91.48 €
PDF
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91.48 €