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Homepage>UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
sklademVydáno: 2004-05-28
UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General

UNE EN 60749-1:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 1: General

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 1: Generalidades.

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Označení normy:UNE EN 60749-1:2004
Počet stran:24
Vydáno:2004-05-28
Status:Norma
DESCRIPTION

This standard UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General is classified in these ICS categories:

  • 31.080.01
Categories:
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