Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
Sponsored link
sklademVydáno: 2003-05-30
UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.

UNE EN 60749-10:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 10: Choques mecánicos.

Format
Availability
Price and currency
Anglicky PDF
Immediate download
48.96 €
Anglicky Hardcopy
In stock
48.96 €
Španělsky PDF
Immediate download
40.80 €
Španělsky Hardcopy
In stock
40.80 €
Označení normy:UNE EN 60749-10:2003
Počet stran:15
Vydáno:2003-05-30
Status:Norma
DESCRIPTION

This standard UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock. is classified in these ICS categories:

  • 31.080.01
Categories:
Print