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sklademVydáno: 2003-11-21
UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 19: Resistencia de la pastilla al cizallamiento.
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| Označení normy: | UNE EN 60749-19:2003 |
| Počet stran: | 18 |
| Vydáno: | 2003-11-21 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 60749-19:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength is classified in these ICS categories:
- 31.080.01
Categories: