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sklademVydáno: 2005-03-16
UNE EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.
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| Označení normy: | UNE EN 60749-23:2005 |
| Počet stran: | 25 |
| Vydáno: | 2005-03-16 |
| Status: | Norma |
DESCRIPTION
This standard UNE EN 60749-23:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life is classified in these ICS categories:
- 31.080.01
Categories: