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Homepage>UNE EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling
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sklademVydáno: 2004-06-11
UNE EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling

UNE EN 60749-25:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 25: Ciclos de temperatura.

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Označení normy:UNE EN 60749-25:2004
Počet stran:33
Vydáno:2004-06-11
Status:Norma
DESCRIPTION

This standard UNE EN 60749-25:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling is classified in these ICS categories:

  • 31.080.01
Categories:
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