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UNE EN 60749-27:2006/A1:2012
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 27: Ensayo de la sensibilidad de la descarga electrostática. Modelo máquina (HBM) (Ratificada por AENOR en enero de 2013.)
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Označení normy: | UNE EN 60749-27:2006/A1:2012 |
Počet stran: | 11 |
Vydáno: | 2013-01-01 |
Status: | Změna |
DESCRIPTION
This standard UNE EN 60749-27:2006/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.) is classified in these ICS categories:
- 31.080.01
Categories: