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sklademVydáno: 2011-11-01
UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 29: Ensayo de enclavamiento. (Ratificada por AENOR en noviembre de 2011.)
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Označení normy: | UNE EN 60749-29:2011 |
Počet stran: | 26 |
Vydáno: | 2011-11-01 |
Status: | Norma |
DESCRIPTION
This standard UNE EN 60749-29:2011 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.) is classified in these ICS categories:
- 31.080.01
Categories: