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Homepage>UNE EN 60749-31:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
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sklademVydáno: 2004-03-18
UNE EN 60749-31:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)

UNE EN 60749-31:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 31: Inflamabilidad de dispositivos con encapsulado plástico (provocada internamente).

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Označení normy:UNE EN 60749-31:2004
Počet stran:16
Vydáno:2004-03-18
Status:Norma
DESCRIPTION

This standard UNE EN 60749-31:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced) is classified in these ICS categories:

  • 31.080.01
Categories:
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