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Homepage>UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
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sklademVydáno: 2005-03-16
UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave

UNE EN 60749-33:2005

Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave

Dispositivos semiconductores. Ensayos mecánicos y climáticos. Parte 33: Resistencia a la humedad acelerada. Autoclave no polarizada

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Označení normy:UNE EN 60749-33:2005
Počet stran:17
Vydáno:2005-03-16
Status:Norma
DESCRIPTION

This standard UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave is classified in these ICS categories:

  • 31.080.01
Categories:
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