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sklademVydáno: 2007-01-01
UNE EN 60749-35:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 35: Microscopía acústica para componentes electrónicos encapsulados en plástico (IEC 60749-35:2006) (Ratificada por AENOR en enero de 2007.)
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Označení normy: | UNE EN 60749-35:2006 |
Počet stran: | 25 |
Vydáno: | 2007-01-01 |
Status: | Norma |
DESCRIPTION
This standard UNE EN 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.) is classified in these ICS categories:
- 31.080.01
Categories: